New arrival

2024/10/23

• Parallel line short failure localization by DI-EBAC observation with a Schottky

2024/10/23

• Probing a 3 nm Device for Electrical Characteristic Measurements

2024/10/23

• High resolution SEM imaging of mesoporous carbon in a fuel cell catalyst

2024/10/23

• Crystal structure analyses of barite (BaSO4) by cathodoluminescence

2024/10/23

• Visualization of lithium-ion battery binder micro topography

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News release

2024/08/22

• New Tabletop Microscopes with Enhanced Usability: TM4000PlusIII and TM4000III

2024/06/25

• Hitachi High-Tech Launches the SU3900SE and SU3800SE Series High-Resolution

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