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Title Automatic foreign particle analysis of multi-area using the Macro Function
Details HTD-SEM-E152
Overview ”Automatic foreign particle analysis of multi-area using the Macro Function”

Metal particles dispersed on 33 stubs were analyzed as pseudo foreign particles using “Macro Function” software. SEM images of 3X4 fields in the central area of 5 mm square on each stub were automatically captured. Number of particles, maximum dimension, and aspect ratio of each particle on acquired 396 BSE images were automatically measured with an image analysis software, Image-Pro.

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Related links (products)
Product type Scanning Electron Microscopes (SEM)
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Data / Data Sheet
Issue date 2021/03/16
Inquiry Inquiry
No. HTD-SEM-E152