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Title 3D Analysis of Metallic Foreign Substances Collected on Filters
Details HTD-SEM-E160
Overview ”3D Analysis of Metallic Foreign Substances Collected on Filters”

Foreign particles collected on a φ 47 mm filter were analayzed using SEM-EDX and Nano 3D Optical Interferomer. Particles on the whole filter were automatically detected and analyzed by SEM-EDX. One particle consisting of Fe and Cr was then three dimensionally visualized by Nano 3D Optical Interferomer. Its maximum height turned out to be 8.13 μm.

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Related links (products)
Product type ・Scanning Electron Microscopes (SEM)
・Coherence Scanning Interferometry (CSI)
Field 1 Environment
Field 2 Atmosphere / Dust
Information type Technical Data / Data Sheet
Issue date 2021/04/26
Inquiry Inquiry
No. HTD-SEM-E160