Overview |
“TEM observation of a polishing slurry using a microchannel device for liquid: K-kit”
Polishing slurry was observed using K-kit, liquid TEM technique. Unlike a quantity of particles aggregating in dried state, particles with diameter of 10~200 nm were dispersed throughout in liquid to allow observation of particle dispersion.
Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |