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Title Consecutive acquisition of diffraction patterns using the Nano analysis function
Details HTD-TEM-E037
Overview Consecutive acquisition of diffraction patterns using the Nano analysis function

Multiple Selected-Area diffraction patterns were automatically acquired from designated regions of Crocidolite using Nano analysis function. The regions and their capturing order can be set on TEM image to accelerate asbestos analysis.

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Related links (products)
Product type Transmission Electron Microscopes (TEM)
Field 1 Environment
Field 2 Atmosphere / Dust
Information type Technical Data / Data Sheet
Issue date 2020/03/12
Inquiry Inquiry
No. HTD-TEM-E037