Title | High contrast observation of a 14 nm FinFET using a 120 kV TEM |
---|---|
Details | HTD-TEM-E038 |
Overview | “High contrast observation of a 14 nm FinFET using a 120 kV TEM“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Related links (products) | |
Product type | Transmission Electron Microscopes (TEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2020/04/01 |
Inquiry | Inquiry |
No. | HTD-TEM-E038 |