Title | 120 kV TEM observation of Cross sectional sample from a 64 layer 3D NAND |
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Details | HTD-TEM-E044 |
Overview | “120 kV TEM observation of Cross sectional sample from a 64 layer 3D NAND“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Related links (products) | |
Product type | Transmission Electron Microscopes (TEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2020/07/13 |
Inquiry | Inquiry |
No. | HTD-TEM-E044 |