Title | Reflectance measurementof In-Plane distribution of Wafer (Absolute Reflectance : |
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Details | UV080011E |
Overview | Reflectance measurementof In-Plane distribution of Wafer (Absolute Reflectance : |
Product type | UV-Visible/NIR Spectrophotometers (UV-Vis/NIR) |
Field 1 | ・Battery / Energy ・Materials science |
Field 2 | ・Battery ・Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals |
Information type | Technical Note |
Issue date | 2008/12/26 |
Inquiry | Inquiry |
No. | UV080011E |