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Applications：Reflectance measurementof In-Plane distribution of Wafer (Absolute Reflectance :

Title Reflectance measurementof In-Plane distribution of Wafer (Absolute Reflectance :
Details UV080011E
Overview Reflectance measurementof In-Plane distribution of Wafer (Absolute Reflectance :
Product type UV-Visible/NIR Spectrophotometers (UV-Vis/NIR)
Field 1 ・Battery / Energy
・Materials science
Field 2 ・Battery
・Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Note
Issue date 2008/12/26
Inquiry Inquiry
No. UV080011E