| Overview |
To observe the nano-structure, the composition and the physical properties of the same crystals and grain boundary area, a prior flattening of the desired sample surface is extremely necessary. However, as polishing flaws and residue of polishing agents on a mechanically polished sample surface may affect the observation it is not the ideal observation surface. The ion beam flatmilling® process will be the optimal preparation method for this purpose. In this data sheet, the and mechanically polished surface and the additionally ion-milled surface of a hot-deformed Nd-Fe-B permanent magnet was observed with the magnetic force microscopy (MFM) and the results of the topography and the magnetism distribution were compared. |
