Hitachi

サイト名称 日立ハイテク

Title Effects of the Flatmilling® on the AFM Observation of a Nd-Fe-B Magnet
Details HTD-AFM-E005
Overview To observe the nano-structure, the composition and the physical properties of the same crystals and grain boundary area, a prior flattening of the desired sample surface is extremely necessary. However, as polishing flaws and residue of polishing agents on a mechanically polished sample surface may affect the observation it is not the ideal observation surface. The ion beam flatmilling® process will be the optimal preparation method for this purpose. In this data sheet, the and mechanically polished surface and the additionally ion-milled surface of a hot-deformed Nd-Fe-B permanent magnet was observed with the magnetic force microscopy (MFM) and the results of the topography and the magnetism distribution were compared.
Product type ・Atomic Force Microscopes (AFM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Metals / Magnetic materials
Information type Technical Note
Issue date 2018/01/29
Inquiry Inquiry
No. HTD-AFM-E005