Title | Simple Acquisition of 3D Information with Flatmilling® |
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Details | HTD-AFM-E006 |
Overview | In this data sheet, the correlation between the tree dimensional nano‐structure, composition and magnetism of a hot‐deformed Nd‐Fe‐B permanent magnet are easily examined by using the flatmilling® with an ion beam. |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Atomic Force Microscopes (AFM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Note |
Issue date | 2018/01/29 |
Inquiry | Inquiry |
No. | HTD-AFM-E006 |