Hitachi

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Applications：Simple Acquisition of 3D Information with Flatmilling®

Title Simple Acquisition of 3D Information with Flatmilling®
Details HTD-AFM-E006
Overview In this data sheet, the correlation between the tree dimensional nano‐structure, composition and magnetism of a hot‐deformed Nd‐Fe‐B permanent magnet are easily examined by using the flatmilling® with an ion beam.
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Atomic Force Microscopes (AFM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Metals / Magnetic materials
Information type Technical Note
Issue date 2018/01/29
Inquiry Inquiry
No. HTD-AFM-E006