Title | Same Area Observation of Graphene on SiO2 with the SEM-AFM Linkage |
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Details | HTD-AFM-E010 |
Overview | At present, the research in graphene related material science and of next generation device applications is very energetic. We observed graphene by using a low acceleration voltage SEM. However, what exactly the black island and line structures in the SEM image of figure 1 represent cannot be identified completely by only using SEM. As AFM, on the contrary, can measure atomic resolution with high accuracy and electric properties it may explain the observation results of SEM. |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Atomic Force Microscopes (AFM) |
Field 1 | Materials science |
Field 2 | Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals |
Information type | Technical Note |
Issue date | 2018/01/29 |
Inquiry | Inquiry |
No. | HTD-AFM-E010 |