| Overview |
At present, the research in graphene related material science and of next generation device applications is very energetic. We observed graphene by using a low acceleration voltage SEM. However, what exactly the black island and line structures in the SEM image of figure 1 represent cannot be identified completely by only using SEM. As AFM, on the contrary, can measure atomic resolution with high accuracy and electric properties it may explain the observation results of SEM. |
