Hitachi

サイト名称 日立ハイテク

Title High-Vacuum Conductive-AFM Observation of an Organic Semiconductor Thin Film
Details HTD-AFM-E012
Overview The advantage of high-vacuum for electric AFM measurements of materials and devices is to prevent the influences of the adsorbed water on the surface, humidity and surface oxidation. This data sheet presents the conductive-AFM observation of an organic semiconductor thin film solar cell consisting of P3HT (organic semiconductor ) and PEDOT (conductive polymer) in a high-vacuum (10-4 Pa).
Product type Atomic Force Microscopes (AFM)
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Note
Issue date 2018/01/29
Inquiry Inquiry
No. HTD-AFM-E012