Title | Cross-section observation of eggshell by Ion Milling system |
---|---|
Details | HTD-SEM-E051 |
Overview | “Cross-section observation of eggshell by Ion Milling system” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Glass / Ceramics / Minerals / Biominerals |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/25 |
Inquiry | Inquiry |
No. | HTD-SEM-E051 |