Title | Low FIB damage lamella preparation of Al plate using NX2000 |
---|---|
Details | HTD-FIB-E007 |
Overview | “Low FIB damage lamella preparation of Al plate using NX2000” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Product type | ・Focused Ion Beam Systems (FIB) ・Electron Microscopes (SEM/TEM/STEM) |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Note |
Issue date | 2016/09/26 |
Inquiry | Inquiry |
No. | HTD-FIB-E007 |