||Low FIB damage lamella preparation of Al plate using NX2000
||“Low FIB damage lamella preparation of Al plate using NX2000”
Clean and less damaged aluminum lamella was prepared using triple beam system, FIB-SEM with incorporated argon ion column. 1kV argon ion milling after FIB processing allows clear imaging of polycrystalline grains or dislocations.
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||・Focused Ion Beam Systems (FIB)
・Electron Microscopes (SEM/TEM/STEM)
||Metals / Magnetic materials