Title | Low damage TEM sample preparation of metallic material using NX2000 |
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Details | HTD-FIB-E004 |
Overview | “Low damage TEM sample preparation of metallic material using NX2000” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Product type | ・Focused Ion Beam Systems (FIB) ・Electron Microscopes (SEM/TEM/STEM) |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Note |
Issue date | 2016/10/07 |
Inquiry | Inquiry |
No. | HTD-FIB-E004 |