Hitachi

サイト名称 日立ハイテク

Title Sample preparation of nitride semiconductor using triple beam systemR
Details HTD-FIB-E010
Overview Sample preparation of nitride semiconductor using triple beam systemR
Product type Focused Ion Beam Systems (FIB)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Note
Issue date 2016/12/01
Inquiry Inquiry
No. HTD-FIB-E010