Hitachi

サイト名称 日立ハイテク

Applications：Three-dimensional (3D) observation of 3D NAND flash memory with NX2000

Title Three-dimensional (3D) observation of 3D NAND flash memory with NX2000
Details HTD-FIB-E011
Overview Three-dimensional (3D) observation of 3D NAND flash memory with NX2000
Product type ・Focused Ion Beam Systems (FIB)
・Electron Microscopes (SEM/TEM/STEM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Note
Issue date 2016/12/01
Inquiry Inquiry
No. HTD-FIB-E011