Title | High quality sample preparation of GaN/InGaN multi quantum well using NX2000 |
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Details | HTD-FIB-E012 |
Overview | High quality sample preparation of GaN/InGaN multi quantum well using NX2000 |
Product type | ・Focused Ion Beam Systems (FIB) ・Electron Microscopes (SEM/TEM/STEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Note |
Issue date | 2016/12/03 |
Inquiry | Inquiry |
No. | HTD-FIB-E012 |