Title	High quality sample preparation of GaN/InGaN multi quantum well using NX2000
Details	HTD-FIB-E012
Overview	High quality sample preparation of GaN/InGaN multi quantum well using NX2000
Product type	・Focused Ion Beam Systems (FIB) ・Electron Microscopes (SEM/TEM/STEM)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Note
Issue date	2016/12/03
Inquiry	Inquiry
No.	HTD-FIB-E012

Title

High quality sample preparation of GaN/InGaN multi quantum well using NX2000

Details

HTD-FIB-E012

Overview

High quality sample preparation of GaN/InGaN multi quantum well using NX2000

Product type

・Focused Ion Beam Systems (FIB)
・Electron Microscopes (SEM/TEM/STEM)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Note

Issue date

2016/12/03

Inquiry

No.

HTD-FIB-E012

Fields

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Applications：High quality sample preparation of GaN/InGaN multi quantum well using NX2000