Hitachi

サイト名称 日立ハイテク

Title High quality sample preparation of GaN/InGaN multi quantum well using NX2000
Details HTD-FIB-E012
Overview High quality sample preparation of GaN/InGaN multi quantum well using NX2000
Product type ・Focused Ion Beam Systems (FIB)
・Electron Microscopes (SEM/TEM/STEM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Note
Issue date 2016/12/03
Inquiry Inquiry
No. HTD-FIB-E012