Hitachi

サイト名称 日立ハイテク

Title TEM sample preparation of nitride semiconductor using Xe ion milling
Details HTD-FIB-E013
Overview TEM sample preparation of nitride semiconductor using Xe ion milling
Product type Focused Ion Beam Systems (FIB)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Note
Issue date 2016/12/03
Inquiry Inquiry
No. HTD-FIB-E013