Title | EBSD Analysis of the non-conductive specimen using the low vacuum |
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Details | HTD-SEM-E022 |
Overview | “EBSD Analysis of the non-conductive specimen using the low vacuum” Further details can be found on our membership website with data library. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Scanning Electron Microscopes (SEM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Glass / Ceramics / Minerals / Biominerals |
Information type | Technical Note |
Issue date | 2016/12/05 |
Inquiry | Inquiry |
No. | HTD-SEM-E022 |