||EBSD Analysis of the non-conductive specimen using the low vacuum
||“EBSD Analysis of the non-conductive specimen using the low vacuum”
Cross sectional EBSD analysis of non-conductive ceramics was performed under high vacuum and low vacuum conditions. While charging caused drift and intensity variation in high vacuum, low vacuum of 30 Pa mitigated charging to enable precise crystal orientation analysis.
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||・Field Emission Scanning Electron Microscopes (FE-SEM)
・Scanning Electron Microscopes (SEM)
・Sample Preparation Devices for TEM/SEM
||Glass / Ceramics / Minerals / Biominerals