||Ion milling for super hard materials using the higher beam tolerance mask with …
||“Ion milling for super hard materials using the higher beam tolerance mask with IM4000PLUS“
Cross section of a cemented carbide drill was prepared by broad ion beam milling with an optional higher beam tolerance mask. 0.9 mm wide and 1.2 mm deep cross section was obtained in 4 hours. Tungsten carbide particles and the interfaces between layers were clearly observed.
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||・Field Emission Scanning Electron Microscopes (FE-SEM)
・Scanning Electron Microscopes (SEM)
・Sample Preparation Devices for TEM/SEM
||Metals / Magnetic materials