Title | Ion milling for super hard materials using the higher beam tolerance mask with … |
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Details | HTD-SEM-E025 |
Overview | “Ion milling for super hard materials using the higher beam tolerance mask with IM4000PLUS“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Scanning Electron Microscopes (SEM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Note |
Issue date | 2016/12/05 |
Inquiry | Inquiry |
No. | HTD-SEM-E025 |