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Title EDX Analysis with less shadowing effects by the FlatQUAD SDD detector of MOF
Details HTD-SEM-E036
Overview “EDX Analysis with less shadowing effects by the FlatQUAD SDD detector of MOF* Membranes (* Metal Organic Frameworks)“

Fracture surface of MOF membrane formed on ceramic porous support was analyzed using conventional Silicon Drift Detector (SDD) and FlatQUAD, annular four-channel SDD inserted between SEM pole piece and the sample. FlatQUAD demonstrated its high sensitivity as well as less shadowing effect.

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Product type Field Emission Scanning Electron Microscopes (FE-SEM)
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Note
Issue date 2016/12/19
Inquiry Inquiry
No. HTD-SEM-E036