Title | EDX Analysis with less shadowing effects by the FlatQUAD SDD detector of MOF |
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Details | HTD-SEM-E036 |
Overview | “EDX Analysis with less shadowing effects by the FlatQUAD SDD detector of MOF* Membranes (* Metal Organic Frameworks)“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Product type | Field Emission Scanning Electron Microscopes (FE-SEM) |
Field 1 | Materials science |
Field 2 | Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals |
Information type | Technical Note |
Issue date | 2016/12/19 |
Inquiry | Inquiry |
No. | HTD-SEM-E036 |