| Overview |
“EDX Analysis with less shadowing effects by the FlatQUAD SDD detector of MOF* Membranes (* Metal Organic Frameworks)“
 Fracture surface of MOF membrane formed on ceramic porous support was analyzed using conventional Silicon Drift Detector (SDD) and FlatQUAD, annular four-channel SDD inserted between SEM pole piece and the sample. FlatQUAD demonstrated its high sensitivity as well as less shadowing effect.
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