||SU3500+Micro-XRF analysis of LED
||”SU3500+Micro-XRF analysis of LED”
LED chip was analyzed using 50kV Micro-XRF on SEM. Fluorescent matters (Sr, Y) in encapsulating medium, LED (Ga) and silver electrode (Ag) at a depth of 700μm were clearly visualized in the Micro-XRF map.
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||Scanning Electron Microscopes (SEM)
||Semiconductors (incl. materials) / Devices / Components / Displays & Lighting