サイト名称 日立ハイテク

Title SU3500+Micro-XRF analysis of LED
Details HTD-SEM-E044
Overview ”SU3500+Micro-XRF analysis of LED”

LED chip was analyzed using 50kV Micro-XRF on SEM. Fluorescent matters (Sr, Y) in encapsulating medium, LED (Ga) and silver electrode (Ag) at a depth of 700μm were clearly visualized in the Micro-XRF map.

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Product type Scanning Electron Microscopes (SEM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Note
Issue date 2017/04/14
Inquiry Inquiry
No. HTD-SEM-E044