Title	High spatial resolution EDX analysis for compound semiconductor with SU9000
Details	HTD-SEM-E047
Overview	High spatial resolution EDX analysis for compound semiconductor with SU9000
Product type	Field Emission Scanning Electron Microscopes (FE-SEM)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Note
Issue date	2017/04/14
Inquiry	Inquiry
No.	HTD-SEM-E047

Title

High spatial resolution EDX analysis for compound semiconductor with SU9000

Details

HTD-SEM-E047

Overview

High spatial resolution EDX analysis for compound semiconductor with SU9000

Product type

Field Emission Scanning Electron Microscopes (FE-SEM)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Note

Issue date

2017/04/14

Inquiry

No.

HTD-SEM-E047

Fields

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Applications：High spatial resolution EDX analysis for compound semiconductor with SU9000