Title | High spatial resolution EDX analysis for compound semiconductor with SU9000 |
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Details | HTD-SEM-E047 |
Overview | High spatial resolution EDX analysis for compound semiconductor with SU9000 |
Product type | Field Emission Scanning Electron Microscopes (FE-SEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Note |
Issue date | 2017/04/14 |
Inquiry | Inquiry |
No. | HTD-SEM-E047 |