Title | Introduction of sample orientation control method using NX2000 -For backside FIB |
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Details | HTD-FIB-E020 |
Overview | “Introduction of sample orientation control method using NX2000 -For backside FIB milling-” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Product type | Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Note |
Issue date | 2017/04/15 |
Inquiry | Inquiry |
No. | HTD-FIB-E020 |