Title	Reduction of curtaining effect using 180° sample posture shifting method of NX2…
Details	HTD-FIB-E022
Overview	Reduction of curtaining effect using 180° sample posture shifting method of NX2000 FIB-SEM Triple Beam
Product type	・Focused Ion Beam Systems (FIB) ・Electron Microscopes (SEM/TEM/STEM)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Note
Issue date	2017/04/15
Inquiry	Inquiry
No.	HTD-FIB-E022

Title

Reduction of curtaining effect using 180° sample posture shifting method of NX2…

Details

HTD-FIB-E022

Overview

Reduction of curtaining effect using 180° sample posture shifting method of NX2000 FIB-SEM Triple Beam

Product type

・Focused Ion Beam Systems (FIB)
・Electron Microscopes (SEM/TEM/STEM)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Note

Issue date

2017/04/15

Inquiry

No.

HTD-FIB-E022

Fields

あなたは医療従事者ですか？
Yes	No
これより先のページは、日本国内の医療関係者の方を対象に日立ハイテク製品に関する情報を提供することを目的としています。一般の方および日本国外の医療関係者への情報提供を目的としたものではありませんのでご了承ください。

Applications：Reduction of curtaining effect using 180° sample posture shifting method of NX2…