Title | High Contrast SEM observation of SiC Semiconductor Dopant Profile using NX2000 |
---|---|
Details | HTD-FIB-E023 |
Overview | “High Contrast SEM observation of SiC Semiconductor Dopant Profile using NX2000” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Product type | Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Note |
Issue date | 2017/04/15 |
Inquiry | Inquiry |
No. | HTD-FIB-E023 |