Hitachi

サイト名称 日立ハイテク

Title Simultaneous high resolution STEM observation of gold nano particle with HF5000
Details HTD-TEM-E013
Overview “Simultaneous high resolution STEM observation of gold nano particle with HF5000”

High resolution STEM images of a gold particle were taken with aberration corrected microscope. Crystal structure of the gold particle was clearly observed with dark field STEM image, bright field STEM image and secondary electron image. These signals can be simultaneously acquired to reduce electron beam irradiation and hence mitigate damage.

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Product type Transmission Electron Microscopes (TEM)
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Note
Issue date 2017/04/15
Inquiry Inquiry
No. HTD-TEM-E013