||Simultaneous high resolution STEM observation of gold nano particle with HF5000
||“Simultaneous high resolution STEM observation of gold nano particle with HF5000”
High resolution STEM images of a gold particle were taken with aberration corrected microscope. Crystal structure of the gold particle was clearly observed with dark field STEM image, bright field STEM image and secondary electron image. These signals can be simultaneously acquired to reduce electron beam irradiation and hence mitigate damage.
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||Transmission Electron Microscopes (TEM)
||Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals