Title | EDX analysis for a SiC-MOSFET semiconductor device with the NX2000 |
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Details | HTD-FIB-E027 |
Overview | EDX analysis for a SiC-MOSFET semiconductor device with the NX2000 |
Related links (products) | |
Product type | Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/24 |
Inquiry | Inquiry |
No. | HTD-FIB-E027 |