Title | High resolution imaging of cross-section of a 3D NAND Flash Memory with the FE-S |
---|---|
Details | HTD-SEM-E064 |
Overview | “High resolution imaging of cross-section of a 3D NAND Flash Memory with the FE-SEM” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Product type | Field Emission Scanning Electron Microscopes (FE-SEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/25 |
Inquiry | Inquiry |
No. | HTD-SEM-E064 |