Title | Secondary Electron imaging of food samples by low accelerating voltage / low vac |
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Details | HTD-SEM-E066 |
Overview | “Secondary Electron imaging of food samples by low accelerating voltage / low vacuum observation” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Related links (products) | |
Product type | Scanning Electron Microscopes (SEM) |
Field 1 | Foods / Beverages |
Field 2 | Foods |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/25 |
Inquiry | Inquiry |
No. | HTD-SEM-E066 |