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Title Secondary Electron imaging of food samples by low accelerating voltage / low vac
Details HTD-SEM-E066
Overview “Secondary Electron imaging of food samples by low accelerating voltage / low vacuum observation”

Various food samples were observed with SEM without coating : fat crystals of chocolate, powder of corn potage, boiled egg yolk, and cross section of buckwheat. Low accelerating voltage SEM and low vacuum SEM revealed their fine crystal structures and surface topography.

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Related links (products)
Product type Scanning Electron Microscopes (SEM)
Field 1 Foods / Beverages
Field 2 Foods
Information type Technical Data / Data Sheet
Issue date 2018/04/25
Inquiry Inquiry
No. HTD-SEM-E066