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Title Wide area milling and observation of the ceramic capacitor
Details HTD-SEM-E070
Overview “Wide area milling and observation of the ceramic capacitor“

Wide area cross section of ceramic capacitor was prepared by ion milling. 54 sets of SEM image and EDX map of 8.7 mm x 1.2 mm cross section were automatically acquired on SEM-EDX. Each surface layer (Ag, Ni, Sn) was clearly identified in the zoomed image and map.

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Related links (products)
Product type ・Scanning Electron Microscopes (SEM)
・Sample Preparation Devices for TEM/SEM
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2018/04/25
Inquiry Inquiry
No. HTD-SEM-E070