| Overview |
“Wide area milling and observation of the ceramic capacitor“
 Wide area cross section of ceramic capacitor was prepared by ion milling. 54 sets of SEM image and EDX map of 8.7 mm x 1.2 mm cross section were automatically acquired on SEM-EDX. Each surface layer (Ag, Ni, Sn) was clearly identified in the zoomed image and map.
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