| Overview |
“Characterization of core-shell nanowire by low voltage SEM and STEM”
 Core-shell semiconductor nanowire was observed with ultrahigh resolution SEM/STEM.
While SE image clearly shows the surface morphology, BF-STEM and DF-STEM images reveal internal structure of the nanowire including core, inner-shell and outer-shell. EDX map also identified the three layers.
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