Title | Characterization of core-shell nanowire by low voltage SEM and STEM |
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Details | HTD-SEM-E073 |
Overview | “Characterization of core-shell nanowire by low voltage SEM and STEM” While SE image clearly shows the surface morphology, BF-STEM and DF-STEM images reveal internal structure of the nanowire including core, inner-shell and outer-shell. EDX map also identified the three layers. Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Product type | Field Emission Scanning Electron Microscopes (FE-SEM) |
Field 1 | Materials science |
Field 2 | Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/25 |
Inquiry | Inquiry |
No. | HTD-SEM-E073 |