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Title Characterization of core-shell nanowire by low voltage SEM and STEM
Details HTD-SEM-E073
Overview “Characterization of core-shell nanowire by low voltage SEM and STEM”

Core-shell semiconductor nanowire was observed with ultrahigh resolution SEM/STEM.
While SE image clearly shows the surface morphology, BF-STEM and DF-STEM images reveal internal structure of the nanowire including core, inner-shell and outer-shell. EDX map also identified the three layers.

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Related links (products)
Product type Field Emission Scanning Electron Microscopes (FE-SEM)
Field 1 Materials science
Field 2 Nanomaterials / Catalysts / Battery materials / Composite materials / Crystals
Information type Technical Data / Data Sheet
Issue date 2018/04/25
Inquiry Inquiry
No. HTD-SEM-E073