| Overview |
“TEM observation of Ar milling sample and electrolytic polishing sample ofFe single crystal”
 TEM lamellas of Fe single crystal were prepared by electrolytic polishing and Ar ion milling on FIB-SEM-Ar Triple Beam system. While small ion damages were recognized on ion milled sample, dislocations were clearly observed with much weaker bend contours than those on electrolytic polished sample.
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