Title | TEM observation of Ar milling sample and electrolytic polishing sample of Fe sin |
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Details | HTD-FIB-E039 |
Overview | “TEM observation of Ar milling sample and electrolytic polishing sample ofFe single crystal” Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/science/guide/ |
Related links (products) | |
Product type | ・Focused Ion Beam Systems (FIB) ・Transmission Electron Microscopes (TEM) |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/25 |
Inquiry | Inquiry |
No. | HTD-FIB-E039 |