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Title TEM observation of Ar milling sample and electrolytic polishing sample of Fe sin
Details HTD-FIB-E039
Overview “TEM observation of Ar milling sample and electrolytic polishing sample ofFe single crystal”

TEM lamellas of Fe single crystal were prepared by electrolytic polishing and Ar ion milling on FIB-SEM-Ar Triple Beam system. While small ion damages were recognized on ion milled sample, dislocations were clearly observed with much weaker bend contours than those on electrolytic polished sample.

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Related links (products)
Product type ・Focused Ion Beam Systems (FIB)
・Transmission Electron Microscopes (TEM)
Field 1 Materials science
Field 2 Metals / Magnetic materials
Information type Technical Data / Data Sheet
Issue date 2018/04/25
Inquiry Inquiry
No. HTD-FIB-E039