Title	Application of Lift-out method with the FIB-SEM
Details	HTD-FIB-E040
Overview	Application of Lift-out method with the FIB-SEM
Related links (products)	Focused Ion and Electron Beam System & Triple Beam System NX2000
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2018/04/25
Inquiry	Inquiry
No.	HTD-FIB-E040

Title

Application of Lift-out method with the FIB-SEM

Details

HTD-FIB-E040

Overview

Application of Lift-out method with the FIB-SEM

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2018/04/25

Inquiry

No.

HTD-FIB-E040

Fields

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Applications：Application of Lift-out method with the FIB-SEM