Title | Comparison of FIB damaged layer of GaN |
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Details | HTD-FIB-E028 |
Overview | “Comparison of FIB damaged layer of GaN” Further details can be found on our membership website. We would appreciate your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Related links (products) | |
Product type | ・Focused Ion Beam Systems (FIB) ・Transmission Electron Microscopes (TEM) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2018/04/24 |
Inquiry | Inquiry |
No. | HTD-FIB-E028 |