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Title Wide Area Three-dimensional image of Microlens
Details HTD-SEM-E082
Overview “Wide Area Three-dimensional image of Microlens“

A wide area 3D image of microlens was generated from multiple 3D images using 3D visualization software, Hitachi Map 3D. In addition to topography image showing height information in different colors, horizontal distance, vertical height and angle of the top and the bottom of each lens can be measured on extracted cross-section profile.

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Related links (products)
Product type Scanning Electron Microscopes (SEM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2018/11/09
Inquiry Inquiry
No. HTD-SEM-E082