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Title Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto
Details HTD-FIB-E041
Overview Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Automatic Micro-Sampling System
Related links (products)
Product type Focused Ion Beam Systems (FIB)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2018/11/12
Inquiry Inquiry
No. HTD-FIB-E041