Title	Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto
Details	HTD-FIB-E041
Overview	Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Automatic Micro-Sampling System
Related links (products)	Focused Ion and Electron Beam System & Triple Beam System NX2000
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2018/11/12
Inquiry	Inquiry
No.	HTD-FIB-E041

Title

Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto

Details

HTD-FIB-E041

Overview

Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Automatic Micro-Sampling System

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2018/11/12

Inquiry

No.

HTD-FIB-E041

Fields

あなたは医療従事者ですか？
はい	いいえ
これより先のページは、日本国内の医療関係者の方を対象に日立ハイテク製品に関する情報を提供することを目的としています。一般の方および日本国外の医療関係者への情報提供を目的としたものではありませんのでご了承ください。

Applications：Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto