Title	Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto
Details	HTD-FIB-E041
Overview	Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Automatic Micro-Sampling System
Related links (products)	Focused Ion and Electron Beam System & Triple Beam System NX2000
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2018/11/12
Inquiry	Inquiry
No.	HTD-FIB-E041

Title

Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto

Details

HTD-FIB-E041

Overview

Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Automatic Micro-Sampling System

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2018/11/12

Inquiry

No.

HTD-FIB-E041

Fields

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Applications：Continuous extraction of TEM lamellae from an 3D NAND flash memory with the Auto