Title	The Auto Microsampling for a charging sample
Details	HTD-FIB-E046
Overview	The Auto Microsampling for a charging sample
Related links (products)	Focused Ion and Electron Beam System & Triple Beam System NX2000
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	・Glass / Ceramics / Minerals / Biominerals ・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2018/11/12
Inquiry	Inquiry
No.	HTD-FIB-E046

Title

The Auto Microsampling for a charging sample

Details

HTD-FIB-E046

Overview

The Auto Microsampling for a charging sample

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

・Glass / Ceramics / Minerals / Biominerals
・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2018/11/12

Inquiry

No.

HTD-FIB-E046

Fields

あなたは医療従事者ですか？
Yes	No
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Applications：The Auto Microsampling for a charging sample