Title | The Auto Microsampling for a charging sample |
---|---|
Details | HTD-FIB-E046 |
Overview | The Auto Microsampling for a charging sample |
Related links (products) | |
Product type | Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | ・Glass / Ceramics / Minerals / Biominerals ・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2018/11/12 |
Inquiry | Inquiry |
No. | HTD-FIB-E046 |