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Title SEM observation of a solder joint interface with the Ethos NX5000
Details HTD-FIB-E056
Overview SEM observation of a solder joint interface with the Ethos NX5000
Related links (products)
Product type Focused Ion Beam Systems (FIB)
Field 1 Materials science
Field 2 ・Metals / Magnetic materials
・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2018/11/12
Inquiry Inquiry
No. HTD-FIB-E056