Title	SEM observation of a solder joint interface with the Ethos NX5000
Details	HTD-FIB-E056
Overview	SEM observation of a solder joint interface with the Ethos NX5000
Related links (products)	Focused Ion and Electron Beam System Ethos NX5000 Series
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	・Metals / Magnetic materials ・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2018/11/12
Inquiry	Inquiry
No.	HTD-FIB-E056

Title

SEM observation of a solder joint interface with the Ethos NX5000

Details

HTD-FIB-E056

Overview

SEM observation of a solder joint interface with the Ethos NX5000

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

・Metals / Magnetic materials
・Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2018/11/12

Inquiry

No.

HTD-FIB-E056

Fields

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Applications：SEM observation of a solder joint interface with the Ethos NX5000