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Applications：Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative AFM-SEM In

Title Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative AFM-SEM In
Details HTD-AFM-E027
Overview Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative AFM-SEM Investigation via Hitachi’s SÆMic. Technology
Related links (products)
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Atomic Force Microscopes (AFM)
Field 1 Materials science
Field 2 Metals / Magnetic materials
Information type Technical Data / Data Sheet
Issue date 2019/03/12
Inquiry Inquiry
No. HTD-AFM-E027