Title | Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative AFM-SEM In |
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Details | HTD-AFM-E027 |
Overview | Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative AFM-SEM Investigation via Hitachi’s SÆMic. Technology |
Related links (products) | |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Atomic Force Microscopes (AFM) |
Field 1 | Materials science |
Field 2 | Metals / Magnetic materials |
Information type | Technical Data / Data Sheet |
Issue date | 2019/03/12 |
Inquiry | Inquiry |
No. | HTD-AFM-E027 |