Title | Analysis of a foreign particle inside a multilayer film |
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Details | HTD-SEM-E093 |
Overview | “Analysis of a foreign particle inside a multilayer film” Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Related links (products) | |
Product type | ・Scanning Electron Microscopes (SEM) ・Coherence Scanning Interferometry (CSI) |
Field 1 | Chemicals |
Field 2 | Polymers / Tire / Gum |
Information type | Technical Data / Data Sheet |
Issue date | 2019/04/19 |
Inquiry | Inquiry |
No. | HTD-SEM-E093 |