Hitachi

サイト名称 日立ハイテク

  • Top
  • App List
  • SEM observation of an SRAM structure (comparison b
Title SEM observation of an SRAM structure (comparison between FF and HR modes)
Details HTD-FIB-E057
Overview SEM observation of an SRAM structure (comparison between FF and HR modes)
Related links (products)
Product type Focused Ion Beam Systems (FIB)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2019/04/19
Inquiry Inquiry
No. HTD-FIB-E057