サイト名称 日立ハイテク

  • Top
  • App List
  • Correlative imaging of Multi-layer ceramic capacit
Title Correlative imaging of Multi-layer ceramic capacitor with SEM and SPM linkage sy
Details HTD-SEM-E098

“SEM-SPM correlative imaging of multi-layer ceramic capacitor”

Cross section of multi-layer ceramic capacitor was observed with SEM and SPM using correlative imaging technique. While positive electrode looked dark, negative electrode looked bright in SEM with applied voltage. Adjacent ceramic layers showed brightness gradient. Kelvin probe Force Microscope (KFM) image of the same field of view also showed bright and dark electrodes as well as electric potential gradient.

Further details can be found on our membership website with data library.
Looking forward to your joining.
About our membership site, see

Related links (products)
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Atomic Force Microscopes (AFM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2019/06/04
Inquiry Inquiry
No. HTD-SEM-E098