| Overview |
“SEM-AFM correlative imaging of directed self-assembled polymer”
 Directed self-assembled polymer (PS/PMMA) was observed with SEM and AFM using correlative imaging technique. While SEM suggested uniform distribution of pores and their vertical orientation, AFM revealed their depth (about 20 nm) as well as diameters (about 20 nm) and intervals (about 40 nm).
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