Hitachi

サイト名称 日立ハイテク

  • Top
    •
  • App List
    •
  • High-Resolution and True 3D Measurements of High-A
    •

Applications：High-Resolution and True 3D Measurements of High-Aspect-Ratio Surface Structures

Title High-Resolution and True 3D Measurements of High-Aspect-Ratio Surface Structures
Details HTD-AFM-E028
Overview High-Resolution and True 3D Measurements of High-Aspect-Ratio Surface Structures on a Butterfly Wing Using the AFM
Related links (products)
Product type ・Field Emission Scanning Electron Microscopes (FE-SEM)
・Atomic Force Microscopes (AFM)
Field 1 Life science
Field 2 Biology
Information type Technical Data / Data Sheet
Issue date 2019/11/05
Inquiry Inquiry
No. HTD-AFM-E028