Title | High-Resolution and True 3D Measurements of High-Aspect-Ratio Surface Structures |
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Details | HTD-AFM-E028 |
Overview | High-Resolution and True 3D Measurements of High-Aspect-Ratio Surface Structures on a Butterfly Wing Using the AFM |
Related links (products) | |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Atomic Force Microscopes (AFM) |
Field 1 | Life science |
Field 2 | Biology |
Information type | Technical Data / Data Sheet |
Issue date | 2019/11/05 |
Inquiry | Inquiry |
No. | HTD-AFM-E028 |