Title | Cryo-FIB milling and cross-sectional SEM observation of InP |
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Details | HTD-FIB-E067 |
Overview | Cryo-FIB milling and cross-sectional SEM observation of InP |
Related links (products) | |
Product type | Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2019/11/11 |
Inquiry | Inquiry |
No. | HTD-FIB-E067 |