Title	Cryo-FIB milling and cross-sectional SEM observation of InP
Details	HTD-FIB-E067
Overview	Cryo-FIB milling and cross-sectional SEM observation of InP
Related links (products)	Focused Ion and Electron Beam System Ethos NX5000 Series
Product type	Focused Ion Beam Systems (FIB)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2019/11/11
Inquiry	Inquiry
No.	HTD-FIB-E067

Title

Cryo-FIB milling and cross-sectional SEM observation of InP

Details

HTD-FIB-E067

Overview

Cryo-FIB milling and cross-sectional SEM observation of InP

Related links (products)

Product type

Focused Ion Beam Systems (FIB)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2019/11/11

Inquiry

No.

HTD-FIB-E067

Fields

あなたは医療従事者ですか？
Yes	No
これより先のページは、日本国内の医療関係者の方を対象に日立ハイテク製品に関する情報を提供することを目的としています。一般の方および日本国外の医療関係者への情報提供を目的としたものではありませんのでご了承ください。

Applications：Cryo-FIB milling and cross-sectional SEM observation of InP