Title | Crystal orientation measurement of 3D NAND flash memory using TKD method |
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Details | HTD-SEM-E115 |
Overview | “Crystal orientation measurement of 3D NAND flash memory using TKD method“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Related links (products) | |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Focused Ion Beam Systems (FIB) |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2019/11/12 |
Inquiry | Inquiry |
No. | HTD-SEM-E115 |