Title | High Resolution Plan View Observation and EDX Analysis of DRAM Capacitors |
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Details | HTD-SEM-E118 |
Overview | “High Resolution Plan View Observation and EDX Analysis of DRAM Capacitors“ Further details can be found on our membership website with data library. Looking forward to your joining. About our membership site, see https://www.hitachi-hightech.com/global/en/support/sinavi/ |
Related links (products) | |
Product type | ・Field Emission Scanning Electron Microscopes (FE-SEM) ・Sample Preparation Devices for TEM/SEM |
Field 1 | Materials science |
Field 2 | Semiconductors (incl. materials) / Devices / Components / Displays & Lighting |
Information type | Technical Data / Data Sheet |
Issue date | 2019/11/12 |
Inquiry | Inquiry |
No. | HTD-SEM-E118 |