Title	FIB processing and TEM observation of ceramic capacitor using the side entry
Details	HTD-FIB-E078
Overview	FIB processing and TEM observation of ceramic capacitor using the side entry holder linkage system
Related links (products)	Focused Ion and Electron Beam System Ethos NX5000 Series
Product type	・Focused Ion Beam Systems (FIB) ・Transmission Electron Microscopes (TEM)
Field 1	Materials science
Field 2	Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type	Technical Data / Data Sheet
Issue date	2020/04/01
Inquiry	Inquiry
No.	HTD-FIB-E078

Title

FIB processing and TEM observation of ceramic capacitor using the side entry

Details

HTD-FIB-E078

Overview

FIB processing and TEM observation of ceramic capacitor using the side entry holder linkage system

Related links (products)

Product type

・Focused Ion Beam Systems (FIB)
・Transmission Electron Microscopes (TEM)

Field 1

Materials science

Field 2

Semiconductors (incl. materials) / Devices / Components / Displays & Lighting

Information type

Technical Data / Data Sheet

Issue date

2020/04/01

Inquiry

No.

HTD-FIB-E078

Fields

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Applications：FIB processing and TEM observation of ceramic capacitor using the side entry