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Title FIB processing and TEM observation of ceramic capacitor using the side entry
Details HTD-FIB-E078
Overview FIB processing and TEM observation of ceramic capacitor using the side entry holder linkage system
Related links (products)
Product type ・Focused Ion Beam Systems (FIB)
・Transmission Electron Microscopes (TEM)
Field 1 Materials science
Field 2 Semiconductors (incl. materials) / Devices / Components / Displays & Lighting
Information type Technical Data / Data Sheet
Issue date 2020/04/01
Inquiry Inquiry
No. HTD-FIB-E078